Dashro Trade presents localy AppNano, US.
AppNano, U.S.A – Applied NanoStructures, Inc. develops, manufactures, and supplies various nanostructures including both conventional and specialized SPM probes for most applications. AppNano's leverage extensive experience in nanofabrication technology and research in AFM probes to supply the highest quality probes utilizing the latest technology in the market. AppNano's in-house clean room facility combined with state-of-the-art characterization tools enables rapid prototyping, adaptability, and versatility in designing and developing new products. Major research programs are continuously underway both in-house and with external collaborators to develop high performance probes for advanced applications. AppNano's mission is to provide the highest quality SPM probes for standard, advanced and customized applications at a faster speed and more affordable price.
In addition to providing you with Appnano's standard catalog of products, AppNano enjoys working with customers to develop new probes or devices for advanced applications. Our experienced R&D Team takes pride in using our knowledge in silicon nanofabrication technology to realize these new ideas.
AppNano's services includes also Fabrication services. For more details don’t hesitate and contact us
Products
Standard silicon probes are available for tapping mode, contact mode, and force modulation mode applications. |
Silicon nitride probes have a bare silicon tip. They are ideally suited for imaging biological samples in both air and fluid mediums, and are available with a variety of spring constants. |
Colloidal Probes are used to study colloidal interactions between two surfaces and to quantify the interactive properties. |
Don’t see your product here? Applied NanoStructures creates many custom products upon request. |
Quick Reference Guide
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Application |
SPM Probe Model |
Brief Description |
Cantilever |
Spring |
Resonance |
Options |
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Tapping / Non-Contact Mode |
Silicon Tapping Mode Tip View Probe |
160 |
93 |
300 |
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Long Cantilever Tapping Mode Probe |
225 |
45 |
190 |
A, SS, TL |
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Silicon Soft Tapping Mode Probe |
150 |
7 |
150 |
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Silicon Tapping Mode Probe |
125 |
40 |
300 |
A, SS, TL |
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Force Modulation Mode Probe |
225 |
3.0 |
62 |
A, G, GG, SS, TL |
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Silicon Nitride Probe, Rectangular Cantilever |
100 |
0.28 |
66 |
G, GG, TL |
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Silicon Nitride Probe, V- Shape, Narrow Cantilever |
100 |
0.29 |
66 |
G, GG, TL |
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Silicon Nitride Probe, V- Shape, Wide Cantilever |
100 |
0.41 |
67 |
G, GG, TL |
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Contact Mode |
100 |
0.088 |
42 |
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Silicon Nitride, Rectangular Cantilever |
200 |
0.035 |
17 |
G, GG, TL |
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Silicon Nitride, V- Shape, Narrow Cantilever |
200 |
0.045 |
17 |
G, GG, TL |
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Silicon Nitride, V- Shape, Wide Cantilever |
200 |
0.081 |
17 |
G, GG, TL |
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Short Cantilever Contact Mode probe |
225 |
0.16 |
23 |
A, G, GG, SS, TL |
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Silicon Contact Mode probe |
450 |
0.29 |
17 |
A, G, GG, SS, TL |
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Biological Applications |
Nitride Probe, Rectangular Cantilever |
100 |
0.011 |
21 |
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Nitride Probe, Rectangular Cantilever |
50 |
0.084 |
77 |
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Force Modulation |
5 Tipless Cantilevers per chip for spring constant calibration |
52-442 |
0.12-77 |
14-1000 |
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Force Modulation Mode Probe |
225 |
3.0 |
62 |
A, G, GG, SS, TL |
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Magnetic Force Imaging |
225 |
3.0 |
62 |
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Trench Depth Measurement |
High Aspect Ratio Silicon Probes |
125 |
40 |
300 |
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Membranes |
Thin Membranes of Silicon |
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Thin Membranes of Silicon Nitride |
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Thin Membranes of Silicon Oxide |