Reltech 8014-
High Power HTOL System
Today’s low geometry semiconductor devices require a different approach to performing High Temperature Operating Life (HTOL) and “Burn-In”. Core Leakage currents vary greatly between device die, even when from the same wafer, and are significantly higher than those of larger geometry devices. These leakage currents result in self-heating within the device and increased junction temperatures (Tj).
In order to control the junction temperature to within acceptable limits and to increase product yield, it is necessary to control the temperature of each device
independently. This is not possible in conventional chamber based HTOL systems.
Reltech Limited is pleased to announce the latest addition to its portfolio of semiconductor qualification test systems. The Reltech 8000 series HTOL system incorporating iSocket™ technology is designed for use by Independent Test Houses and semiconductor IDM companies operating their own Quality and Reliability Laboratories and provides the highest level of thermal control possible for High Temperature Operating Life Testing and Burn-In of the very latest low geometry, high power semiconductor devices.
-Reltech 8014 HTOL System Features
iSocket™ Technology
Open Rack – Room Temperature (RTBI) non chamber design
Easy to load trays on telescopic slides
Individual DUT Temperature Measurement & Control
DUT Monitoring with Auto shut down
Multi DUT type HTOL Testing
Remote System & HTOL monitoring- Customer access via VPN
-HTOL System Configuration
Capacity: 14 HTOL Tray Slots
DUT Capacity: Typical 14 x 12 = 168 DUT’s
DUT Power : up to 65W per DUT
I/O: 192 ( 2 x 96 way IDC)
Signal Zones: 14 – 1 per Driver Card Slot
Power Zones: 14 – 1 per HTOL Tray
DUT Power Supplies per HTOL Tray
PSU Qty Volts Current
V1 4 0.6v-3.6v 120A
V2 2 0.75v- 5.0v 10A
V3 2 0.75v- 5.0v 10A
V4 2 0.75v- 5.0v 10A
Reltech 8014 HTOL System MIDAS™ Dynamic Driver Card
24 Vector channels 8Mb Vector depth
5MHz – Vector frequency 200mA driver per channel
2 Voh levels – 1.0v – 5v Vector looping
20 DUT signal monitor channels Test programme conversion
Real Time Monitoring Functions
DUT Case Temperature (Tc)
DUT Junction Temperature (Tj)
Voltage Monitoring: V1 – V4 per group of DUT’s
with auto shut down of all 4 DUT’s
• Current Monitoring: PSU 1-4 per DUT with auto
shut down of all 4 DUT’s
• Monitoring frequency: 100mS
• DUT shut down time: 1.0S
• DUT Monitoring: 20 channels
(typically 1 per DUT) Hi, LO or Activity)
